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Proceedings : the 1980 Canadian Reliability Symposium, May 16-17, 1980, Toronto, Ontario, Canada
- 資料種別:
- 図書
- 責任表示:
- Neville Lewis, chairman
- 言語:
- 英語
- 出版情報:
- Oxford : Pergamon Press, c1980
- 形態:
- 167 p. : ill. ; 28 cm
- 著者名:
- シリーズ名:
- Microelectronics and reliability ; v. 20, no. 1/2 <BA28297566>
- 書誌ID:
- BA44306464
- ISBN:
- 9780080261638 [0080261639]
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