Proceedings : the 1980 Canadian Reliability Symposium, May 16-17, 1980, Toronto, Ontario, Canada

資料種別:
図書
責任表示:
Neville Lewis, chairman
言語:
英語
出版情報:
Oxford : Pergamon Press, c1980
形態:
167 p. : ill. ; 28 cm
著者名:
シリーズ名:
Microelectronics and reliability ; v. 20, no. 1/2 <BA28297566>
書誌ID:
BA44306464
ISBN:
9780080261638 [0080261639]  CiNii Books  Webcat Plus  Google Books
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